【Presentation of Materials!】Collection of 6 Main Case Studies on Semiconductor Testing Challenges Solutions
A clear explanation of case studies related to semiconductor testing, divided into four sections: background, issues, implementation, and results!
This document presents six main case studies addressing challenges related to semiconductor testing, each detailed individually. For example, cases such as "difficulties in maintaining operations due to aging testers" and "insufficient resources for test development and measurement module development." The explanations are clearly structured around four key areas: background, challenges, implementation, and results. This document is available for free. Please check the download link below. 【Overview of Cases】 ■ Difficulties in maintaining operations due to aging testers ■ Insufficient tester specifications required for testing ■ Inability to perform laser trimming on wafers ■ Inability to conduct reliability testing and failure analysis ■ Issues with wafer testing for automotive products ■ Insufficient resources for test development and measurement module development *For more details, please refer to the PDF document or feel free to contact us.
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